IEC-68-2-27 – Section 3.5 Laboratory Shock and Drop Testing Equipment / Mechanical Impact Tester.

IEC-68-2-27 – Section 3.5 Laboratory Shock and Drop Testing Equipment / Mechanical Impact Tester

IEC-68-2-27 – Section 3.5 Laboratory Shock and Drop Testing Equipment is a test device designed to evaluate the resistance of electronic components and devices to mechanical impacts. This equipment, specifically in accordance with IEC-68-2-27 – Section 3.5, can perform tests with 1500G acceleration and 0.5 millisecond pulse duration.

Main Features:

• High Acceleration Capacity: Tests the resistance of components to high-intensity impacts by applying accelerations up to 1500G.
• Short Pulse Duration: Simulates sudden and intense shock conditions with a short pulse duration of 0.5 milliseconds.
• Various Test Modes: Provides flexible test options with different shock waveforms such as half-sine and square waves.
• User-Friendly Control Panel: Allows for easy operation and quick settings adjustments with a touchscreen interface.
• Sturdy Construction: Offers long-lasting and reliable performance with high-rigidity shock tables and robust construction.

Technical Specifications:

• Table Size: Available in various size options, from 40×40 cm to 200×200 cm.
• Maximum Sample Weight: Compatible with weights ranging from 30 kg to 1000 kg.
• Acceleration Range: Can apply accelerations from 300G to 600G for half-sine wave, and from 100G to 150G for square wave.
• Pulse Duration: Adjustable from 20 ms to 40 ms for half-sine wave, and 30 ms for square wave.
• Machine Size: Varies based on the table size; for instance, the machine size for a 40×40 cm table is 120x110x245 cm.
• Machine Weight: Ranges from 1900 kg to 19500 kg, depending on the table size and features.

Applications:

• Electronic Components: Testing sensitive electronic products such as mobile phones, computer components, optical elements.
• Automotive Industry: Evaluating the durability of in-vehicle electronic systems and components.
• Military and Aerospace: Testing equipment designed for harsh conditions.
• Consumer Electronics: Measuring the durability of consumer products against impacts encountered during transportation and use.

Sections of the Standard Where the Test is Included:

• The JESD22-B104 standard is included in the Condition B section. This section requires the test to be conducted with 1500G acceleration and a 0.5 millisecond pulse duration.
• The MIL-STD-202F standard defines shock tests and related procedures in Method 213 (Shock).
• The IEC-68-2-27 standard, Section 3.5, specifies the types of shocks, durations, and acceleration values to be applied for shock testing.

High Acceleration Shock Test System Applications:

Testing the durability of products such as mobile phones, computer components, connectors, optical elements, mobile products, etc.

High Acceleration Shock Test System Specifications:

• Table Size: 15×15 cm, 20×20 cm
• Shock Pulse: Half-sine wave
• Maximum Sample Weight: 5-10 kg
• Acceleration Range: 20G ~ 1500G, 20G ~ 10000G
• Pulse Duration: 0.5 ms ~ 11 ms, 0.2 ms ~ 11 ms

You can also contact us for more information about IEC-68-2-27 – Section 3.5 Laboratory Shock and Drop Testing Equipment / Mechanical Impact Tester and to place orders for custom sizes.

Standard reference

IEC 60068-2-27 (formerly IEC 68-2-27) defines the mechanical shock test (Test Ea); the apparatus requirements are given in the equipment clauses of the standard. The tester applies defined acceleration pulses for laboratory shock and drop testing on each axis.