IP Test Probe B (Jointed Test Finger).

IP Test Probe B (Jointed Test Finger)

IP Test Probe B (Jointed Test Finger) is an essential tool used to verify the basic protection against access to hazardous parts. It is also employed to test access protection via a finger-like probe, making it critical for safety testing of electrical devices.

Applicable Standards:

• IEC 61032, Section 6.1.2.b, Figure 2: This standard defines the required dimensions and shape of the test probe.
• EN/IEC 60950-1, Figure 2a: Specifies the use of this probe for the safety of electronic equipment.
• UL 1278, Figure 8.4: Describes the design and functionality of the test probe used to test access to hazardous parts of devices.

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Test probe B, the standard jointed test finger, is used for IEC 60529 IP accessibility verification.

Standard reference

Test Probe B — the standard jointed test finger — is defined in IEC 61032 and used with IEC 60529 to verify the IP2X access class (protection against finger access). The finger has standardised joints and dimensions and is applied at the test force specified by the standard.