IEC 61215 · IEC 60068-2
PV Module Potential-Induced Degradation (PID) Test System (IEC 61215-2, MQT 21).
Stresses photovoltaic modules with high voltage in heat and humidity to detect potential-induced degradation (IEC 61215-2 MQT 21).
The PV Module PID Test System performs the potential-induced degradation test of IEC 61215-2 (MQT 21), following the chamber method of IEC TS 62804-1. The module is held in heat and humidity — typically 60 °C and 85 % relative humidity — while a high DC voltage equal to the module's rated system voltage is applied between the cells and the frame for the test duration (commonly 96 hours).
Throughout the test the leakage current between the active layer and the frame is monitored and logged, and the module's maximum power and insulation resistance are compared before and after to quantify any degradation. The high-voltage supply offers ±1000 V and ±1500 V system-voltage steps; a dry foil method (temperature only, no humidity) can also be supported.
ULMEKA designs and manufactures this system. The voltage range, the climate chamber and the leakage-monitoring and safety interlocks are built to the module and the applicable standard; the exact configuration is defined during the quotation stage.
Standards
& methods.
Applications.
- IEC 61215-2 MQT 21 / IEC TS 62804-1 PID test
- PV module potential-induced degradation evaluation
- Photovoltaic module type approval
- Solar module test laboratories
ULMEKA engineers test systems
to specification.
If your requirement is outside this catalogue — custom chamber sizes, combined-standard integration, or tailored test profiles — talk to our engineering team.
