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Home Standards EN 60045 / IEC 60045 IP Test Probe B (Jointed Test Finger)
IP Test Probe C and D
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IP Test Probe A

IP Test Probe B (Jointed Test Finger)

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SKU: ULM-TPB Categories: EN 60045 / IEC 60045, EN 60335 / IEC 60335, EN 60529 / IEC 60529, EN 60884 / IEC 60884, EN 60950/ IEC 60950, EN 61032 / IEC 61032, EN 69745 / IEC 69745, IP Test Equipment, Test Probes
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Description

IP Test Probe B (Jointed Test Finger)

IP Test Probe B (Jointed Test Finger) is an essential tool used to verify the basic protection against access to hazardous parts. It is also employed to test access protection via a finger-like probe, making it critical for safety testing of electrical devices.


Applicable Standards:

  • IEC 61032, Section 6.1.2.b, Figure 2: This standard defines the required dimensions and shape of the test probe.
  • EN/IEC 60950-1, Figure 2a: Specifies the use of this probe for the safety of electronic equipment.
  • UL 1278, Figure 8.4: Describes the design and functionality of the test probe used to test access to hazardous parts of devices.

For orders or detailed information about IP Test Probe B, or if you have any questions, please feel free to contact us!

Additional information
İlgili Standartlar

IEC 61032, Bölüm 6.1.2.b, Şekil 2: Bu standart, test probunun boyutları ve şekliyle ilgili gereksinimleri tanımlar.

EN/IEC 60950-1, Şekil 2a: Elektronik ekipmanların güvenliği için bu probun kullanılmasını gerektirir.

UL 1278, Şekil 8.4: Bu, cihazların tehlikeli parçalara erişimi test etmek için kullanılan probun tasarımını ve fonksiyonunu açıklar.

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Test probu çapı: 2.5 mm
Damla topu çapı: 35 mm
Sap çapı: 10 mm
Sap uzunluğu: 100 mm

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Test probu uzunluğu: 100 mm
Test probu çapı: 1.0 mm
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